378-754-15 LCD Plan Apo NIR 100X(t0.7) Objective for bright-field observation in near-infrared range with cover glass compensation Torque High-accuracy measurement is aided by

High-accuracy measurement is aided by a large grip with a sponge-like structure that reduces heat transfer from the operator‰Ûªs hand

The test stand includes adjustable travel stops and a frictional low force brake

with maximum indicator

A non-digital Mitutoyo micrometer provided with a deep frame to enable measurement of sheet metal thickness farther from the edge of a sheet than is possible with a standard micrometer

378-754-15 LCD Plan Apo NIR 100X(t0.7) Objective for bright-field observation in near-infrared range with cover glass compensation Torque High-accuracy measurement is aided bySuitabel for Bright Field Inspection and Laser based repair Applications through 0. 7 or 1. 1 mm LCD cover glass Long Working Distance High Quality Plan Apoochromat Design Wavelength correction from Visible to Near Infrared (1800 nm) Features Model: LCD Plan Apo NIR 100X (t0,7) Magnification: 100x Working distance: Through glass: 12. 3 mm In Air: 12. 06 mm Corrected Wave Length: 480 1800 nm N. A.: 0. 5 f: 2 mm R: 0. 6 m D. F.: 1. 1 m FOV 1: 0. 24 mm