For Profile Projectors and Measuring Microscopes Specification Description: Angular adjustment: ± 10° Graduation: 1° Max. workpiece size: Vertical: Ø 70 mm x 140 mm bei ± 10° inclination: Ø 45 mm x 140 mm Mass: 2.4 kg inspec in a hole through thinner

in a hole through thinner probes

Use these grips with a force sensor and a test frame to create a complete testing system

Type: Knife-edge contact point

Both ends require eye end adapters to mount to Mark-10 force gauges or force sensors

For Profile Projectors and Measuring Microscopes Specification Description: Angular adjustment: ± 10° Graduation: 1° Max. workpiece size: Vertical: Ø 70 mm x 140 mm bei ± 10° inclination: Ø 45 mm x 140 mm Mass: 2.4 kg inspec in a hole through thinnerFor Profile Projectors and Measuring Microscopes Specification Description: Angular adjustment: 10 Graduation: 1 Max. workpiece size: Vertical: 70 mm x 140 mm bei 10 inclination: 45 mm x 140 mm Mass: 2. 4 kg